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 | | Ctl for Test Information of Digital Ics(Reprint) by Rohit Kapur Paperback, 188 Pages, Published 2013 by Springer ISBN-13: 978-1-4757-7800-7, ISBN: 1-4757-7800-7 |
 | | CTL FOR TEST INFORMATION OF DIGITAL ICS(1st Edition) (HB) by Rohit Kapur Hardcover, 186 Pages, Published 2002 by Springer ISBN-13: 978-1-4020-7293-2, ISBN: 1-4020-7293-7 |
 | | CTL for Test Information of Digital ICs by Rohit Kapur 173 Pages, Published 2002 by Springer Science & Business Media ISBN-13: 978-0-306-47826-0, ISBN: 0-306-47826-9 |
 | | VLSI Test Principles and Architectures(1st Edition) Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)) by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Abhijit Chatterjee, Xinghao Chen, William Eklow, Soumendu Bhattacharya, Rohit Kapur, Brion Keller, Xiaowei Li, Yinghua Min, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Kwang-Ting Cheng, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Kuen-Jong Lee, Mike Peng Li, T.M. Mak, Benoit Nadeau-Dostie, Duncan M. Walker, Shianling Wu, Nur A. Touba Hardcover, 808 Pages, Published 2006 by Morgan Kaufmann ISBN-13: 978-0-12-370597-6, ISBN: 0-12-370597-5 |
Rohit Kapur
