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VLSI Test Principles and Architectures(1st Edition)
Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Abhijit Chatterjee, Xinghao Chen, William Eklow, Soumendu Bhattacharya, Rohit Kapur, Brion Keller, Xiaowei Li, Yinghua Min, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Kwang-Ting Cheng, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Kuen-Jong Lee, Mike Peng Li, T.M. Mak, Benoit Nadeau-Dostie, Duncan M. Walker, Shianling Wu, Nur A. Touba
Hardcover, 808 Pages, Published 2006 by Morgan Kaufmann
ISBN-13: 978-0-12-370597-6, ISBN: 0-12-370597-5
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