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 | | System-on-Chip Test Architectures(1st Edition) Nanometer Design for Testability (Volume .) (Systems on Silicon (Volume .)) by Laung-Terng Wang, Nur A. Touba, Charles E. Stroud Hardcover, 896 Pages, Published 2007 by Morgan Kaufmann ISBN-13: 978-0-12-373973-5, ISBN: 0-12-373973-X |
 | | VLSI Test Principles and Architectures(1st Edition) Design for Testability by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu Paperback, 808 Pages, Published 2002 by Morgan Kaufmann ISBN-13: 978-1-4933-0086-0, ISBN: 1-4933-0086-5 |
 | | Electronic Design Automation(1st Edition) Synthesis, Verification, and Test (Systems on Silicon) by Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting Cheng Hardcover, 972 Pages, Published 2009 by Morgan Kaufmann ISBN-13: 978-0-12-374364-0, ISBN: 0-12-374364-8 |
 | | VLSI Test Principles and Architectures(1st Edition) Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)) by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Abhijit Chatterjee, Xinghao Chen, William Eklow, Soumendu Bhattacharya, Rohit Kapur, Brion Keller, Xiaowei Li, Yinghua Min, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Kwang-Ting Cheng, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Kuen-Jong Lee, Mike Peng Li, T.M. Mak, Benoit Nadeau-Dostie, Duncan M. Walker, Shianling Wu, Nur A. Touba Hardcover, 808 Pages, Published 2006 by Morgan Kaufmann ISBN-13: 978-0-12-370597-6, ISBN: 0-12-370597-5 |
 | | Systems on Silicon System-on-Chip Test Architectures : Nanometer Design for Testability Volume . by Charles E. Stroud, Laung-Terng Wang, Nur A. Touba Paperback, 896 Pages, Published 2010 by Morgan Kaufmann ISBN-13: 978-0-08-055680-2, ISBN: 0-08-055680-9 |
 | | VLSI Test Principles and Architectures Design for Testability by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Paperback, 808 Pages, Published 2006 by Morgan Kaufmann ISBN-13: 978-0-08-047479-3, ISBN: 0-08-047479-9 |
 | | System-on-Chip Test Architectures by Laung-Terng Wang Published by Morgan Kaufmann ISBN-13: 978-0-12-405497-4, ISBN: 0-12-405497-8 |
 | | Electronic Design Automation by Laung-Terng Wang Published by Morgan Kaufmann ISBN-13: 978-0-323-28441-7, ISBN: 0-323-28441-8 |
 | | Systems on Silicon Electronic Design Automation : Synthesis, Verification, and Test by Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting Cheng, Wei Wang Paperback, 972 Pages, Published 2009 by Morgan Kaufmann ISBN-13: 978-0-08-092200-3, ISBN: 0-08-092200-7 |
 | | Morgan Kaufmann Series in Systems on Silicon Ser. Electronic Design Automation : Synthesis, Verification, and Test by Laung-Terng Wang Published 2009 ISBN-13: 978-1-282-54215-0, ISBN: 1-282-54215-X |
 | | Morgan Kaufmann Series in Systems on Silicon Ser. VLSI Test Principles and Architectures: Design for Testability by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Published 2006 ISBN-13: 978-1-280-96684-2, ISBN: 1-280-96684-X |
 | | Morgan Kaufmann Series in Systems on Silicon (Hardcover): System-on-Chip Test Architectures : Nanometer Design for Testability by Nur Touba, Charles E. Stroud and Laung-Terng Wang (2008, E-book) by Charles E. Stroud, Laung-Terng Wang, Nur Touba Published 2008 ISBN-13: 978-1-281-10004-7, ISBN: 1-281-10004-8 |
 | | Vlsi Test Principles And Architectures Design For Testability by Laung-Terng Wang Paperback, Published 2011 by Elsevier India ISBN-13: 978-93-80501-55-0, ISBN: 93-80501-55-2 |
 | | System-On-Chip Test Architectures Nanometer Design for Testability. Systems on Sillicon by Laung-Terng Wang, Charles E. Stroud, Nur Touba Digital, 896 Pages, Published 2008 by Elsevier Science & Technology ISBN-13: , ISBN: |
 | | VLSI Test Principles and Architectures by Laung-Terng Wang Ebook ISBN-13: , ISBN: |
 | | Electronic Design Automation by Laung-Terng Wang Ebook ISBN-13: , ISBN: |
Laung-Terng Wang
