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 | | Design for AT-Speed Test, Diagnosis and Measurement(2000th Edition) (Frontiers in Electronic Testing) by Benoit Nadeau-Dostie Hardcover, 239 Pages, Published 1999 by Springer ISBN-13: 978-0-7923-8669-8, ISBN: 0-7923-8669-8 |
 | | "Design for At-Speed Test, Diagnosis and Measurement" (Frontiers in Electronic Testing) by Benoit Nadeau-Dostie Paperback, 260 Pages, Published 2013 by Springer ISBN-13: 978-1-4757-8291-2, ISBN: 1-4757-8291-8 |
 | | Design for at-Speed Test, Diagnosis and Measurement by Benoit Nadeau-Dostie Online Resource, 239 Pages, Published 2006 by Springer Science & Business Media ISBN-13: 978-0-306-47544-3, ISBN: 0-306-47544-8 |
 | | Design for at-Speed Test, Diagnosis and Measurement by Benoit Nadeau-Dostie Published 1999 ISBN-13: 978-1-280-20031-1, ISBN: 1-280-20031-6 |
 | | VLSI Test Principles and Architectures(1st Edition) Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)) by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Abhijit Chatterjee, Xinghao Chen, William Eklow, Soumendu Bhattacharya, Rohit Kapur, Brion Keller, Xiaowei Li, Yinghua Min, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Kwang-Ting Cheng, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Kuen-Jong Lee, Mike Peng Li, T.M. Mak, Benoit Nadeau-Dostie, Duncan M. Walker, Shianling Wu, Nur A. Touba Hardcover, 808 Pages, Published 2006 by Morgan Kaufmann ISBN-13: 978-0-12-370597-6, ISBN: 0-12-370597-5 |
 | | Design for At-Speed Test, Diagnosis and Measurement by Benoit Nadeau-Dostie Ebook ISBN-13: , ISBN: |
Benoit Nadeau-Dostie
