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 | | Advances in X-Ray Analysis, Vol. 32 by Charles S. Barrett, Ron Jenkins, J.V. Gilfrich, John C. Russ, Paul K. Predecki, John V. Gilfrich, Ting C. Huang, Dr. John C. Russ, Ron Jenkins Ms, Denver Research Institute, J. W. Richardson Hardcover, 682 Pages, Published 1989 by Springer ISBN-13: 978-0-306-43236-1, ISBN: 0-306-43236-6 |
Ron Jenkins Ms
