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Information Systems Success Measurement
(Foundations and Trends(r) in Information Systems)
by William Hook Delone, Ephraim R. Mclean, Mclean Delone
Paperback, 136 Pages, Published 2016 by Now Publishers
ISBN-13: 978-1-68083-142-9, ISBN: 1-68083-142-9

All Authors

Ephraim Mclean

William Delone




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