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| Books 1 - 10 of 138 | Previous | Next |


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 |  | The Prince: A Poem by Thomas W. Lee Smith Paperback, 84 Pages, Published 2007 by Kessinger Publishing, LLC
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 |  | Microelectronic Failure Analysis: Desk Reference 2002 Supplement (4th Edition) by Thomas W. Lee Paperback, 175 Pages, Published 2002 by American Society for Metals, 4th Edition
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 |  | Using Qualitative Methods in Organizational Research (Organizational Research Methods) (1st Edition) by Thomas W. Lee Paperback, 208 Pages, Published 1998 by Sage Publications, Inc, 1st Edition
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 |  | Investigation of selective catalytic reduction impact on mercury speciation under simulated N[O.sub.x] emission control conditions.(TECHNICAL PAPER): An ... of the Air & Waste Management Association by Chun W. Lee, Ravi K. Srivastava, S. Behrooz Ghorishi, Thomas W. Hastings, Frank M. Stevens Digital, 21 Pages, Published 2004 by Air and Waste Management Association
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 |  | The Role of Personality and Work Values in Mentoring Programs.: An article from: Review of Business by Felissa K. Lee, Thomas W. Dougherty, Daniel B. Turban Digital, 14 Pages, Published 2000 by St. John's University, College of Business Administration
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 |  | Microelectronic Failure Analysis Desk Reference (International Symposium for Testing and Failure Analysis) (1st Edition) by Thomas W. Lee (Editor) Paperback, Published 1990 by ASM International, 1st Edition
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 |  | Cracking Cases : The Science of Solving Crimes / Henry C. Lee with Thomas W. ONeil by Henry C. Lee Hardcover, Published 2002 by Amherst, N.Y. : Prometheus Books
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 |  | ACM Computing Surveys: Volume 26 Number 1 (ACM Computing Surveys, Volume 26) by Richard R. Muntz, Rajiv Gupta, Scott A. Smolka, Shaji Bhaskar, Thomas W. Malone, Kevin Crowston, Sunggu Lee, Kang Geun Shin Paperback, Published 1994 by ACM Press
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 |  | The Effects Of Family Structure On Organizational Commitment, Intention To Leave And Voluntary Turnover [*].(Statistical Data Included): An article from: Journal of Managerial Issues by Thomas W. Lee, Steven D. Maurer Digital, 30 Pages, Published 1999 by Pittsburg State University - Department of Economics
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 |  | Microelectronic Failure Analysis 3ed by Thomas W Lee Hardcover, Published 1993 by ASM INTERNATIONAL
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