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 |  |  | Metrology Properties Engineered Surfaces (Optoelectronics, Imaging and Sensing Series) (1st Edition) by E. Mainsah (Editor), J.A. Greenwood (Editor), D.G. Chetwynd (Editor) Hardcover, 476 Pages, Published 2000 by Springer, 1st Edition
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 |  |  | Development of Methods for the Characterisation of Roughness in Three Dimensions (Ultra Precision Technology) (Ultra Precision Technology Series) (Rev Edition) by Ken J Stout, Liam Blunt, W. P. Dong, E. Mainsah, N. Luo, T. Mathia, P. J. Sullivan, H. Zahouani Paperback, 384 Pages, Published 2000 by Butterworth-Heinemann, Rev Edition
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